Expo Pass
Expo Plus Pass
Thought Leadership Pass
All-In Pass
Student Explorer Pass
The Echo™ opto-acoustic metrology system delivers non-destructive wafer-level metrology for measurements of single and multi-layer opaque films ranging in thickness from 50Å to 35µm. It utilizes Picosecond laser ultrasonic (PULSE™) technology which has been a workhorse in the semiconductor industry for over 20 years providing comprehensive metal film thickness metrology.