Semiconductor manufacturers continuously seek to improve device quality, production uptime, yield performance and factory optimization. With the smart manufacturing and data science trends occurring now, analyzing data during the test phase has become increasingly important, given the potential for optimizing semiconductor device designs and operations. Most current smart manufacturing solutions are applications focused on solving one problem for one use case. Deploying multiple point solutions creates challenges due to the difficulty and cost to develop, deploy and maintain these applications, and the inevitable reliability issues that arise due to poor integration. A platform approach to data analytics and smart manufacturing enables manufacturers to develop a diverse set of solutions on a single platform with a common development environment that seamlessly integrates the system software and hardware. This presentation will discuss the benefits of a platform approach to smart manufacturing and data analytics that brings together a reliable data source, an action controller, an easy to use development environment, and real-time data processing capabilities to enable manufacturers to achieve data-driven insights and impactful results that positively affect reliability, uptime, yield and factory floor utilization.