Abstract or Demonstration Description: Embedding analog functionality into standard protocol testing has always been a challenge. Any viable solution would need to provide easy to use, out-of-the-box support for standard protocols, including, but limited to, test program APIs, remote access, and automatic design file integration. It also needs to provide a mechanism for parsing files that the Design and DFT engineers already generate as part of their workflow. Ideally, these files could be loaded, executed, and debugged on the ATE with no conversion needed. Incorporating analog instrument control in line with standard protocol operations allows files to be provided directly from the design environment with sequences of protocol transactions and analog operations and delivers the ability to debug to pinpoint specific problems. At production time, everything must be optimized for maximum performance easily. This presentation will explain a novel solution to this challenge and focus on error-prone digital pattern debug of Serial Wire Debug (SWD) and DC measurements and how it can be replaced with this solution. We will detail the before and after debug and production models and demonstrate how much time and effort the customer can save. This opens the door for a new method of testing that maintains design time concepts of abstraction and removes time-consuming translations into ATE specific formats.