Application Specific Solutions To Address Today’s Test Challenges

Abstract or Demonstration Description: The semiconductor industry has always been driven by technological advancements and innovations. Todays mix of general purpose semiconductors, adoption of application specific devises and move towards heterogeneous integration is challenging todays general purpose test infrastructure. Traditional test processes and general purpose solutions are unable to meet the demands of todays rapid expansion in test requirements for a much wider range of applications.
Our poster at the 2023 Semicon West Test Vision event highlights an application-specific testing approach that is set to disrupt the current industry status quo.
Our approach is designed to meet the unique demands of different applications by providing a semi customized modular testing solution that is faster, more efficient, and less expensive than traditional testing methods.
Our solutions are designed to improve the overall efficiency of the test process. By optimizing the testing process for each application, we can reduce test times and improve throughput, resulting in faster time to market for our clients.
An example of application specific modular test solutions is demonstrated through our collaboration with industry leaders in image sensing test solutions than have demonstrated and proven the value in this approach. This poster will share the approach and data collected to validate the above claims.

We believe Applications specific solutions designed to meet the unique demands of different applications will provide improved accuracy, reduced costs, and faster time to market to the semiconductor industry.