AI/ML Enabled Manufacturing Operations

The focus of this session on the specific use cases of AI/ML to enable key operations such as anomaly detection (FDC), quality (Yield management), SPC, etc. as well as advanced predictive maintenance and virtual metrology enhanced by new AI/ML approaches within manufacturing lines will be in focus.

Presentations:

• 2:00 PM – 2:05 PM PDT

  Welcome Remarks and Session Introduction
  

  Session Moderator: Ranjan Chatterjee – PDF Solutions
• 2:05 PM – 2:25 PM PDT

  Smart Manufacturing Process Control: Yield Diagnostics and Prediction with ML-based Techniques
  

  Speaker: Jae-Yong Park, PhD – Samsung
• 2:25 PM – 2:45 PM PDT

  Improving Throughput in Semiconductor Fabs Through a Novel Unsupervised Machine Learning Method
  

  Speaker: Wes Smith, MBA – Galaxy Semiconductor
• 2:45 PM – 3:05 PM PDT

  Enabling Smart Manufacturing in Semiconductor Fabs Using Predictive Design and Process Insights
  

  Speaker: Srividya Jayaram, MS – Siemens EDA
• 3:05 PM – 3:25 PM PDT

  Applying Generative AI for Competitiveness in Semiconductor Manufacturing
  

  Speaker: Christopher Nguyen, PhD – Aitomatic
• 3:25 PM – 3:45 PM PDT

  Machine Learning Improves Final Test Forecast for Semiconductor Fabs
  

  Speaker: Melvin Lee Wei Heng – ONTO INNOVATION
• 3:45 PM – 4:05 PM PDT

  Virtual Metrology: From Pipe Dream to Reality
  

  Speaker: Mike Y. H Kim, PhD – Gauss Labs
• 4:05 PM – 4:25 PM PDT

  How to Use AI for Sustainability to Win in the New ESG Economy
  

  Speaker: Andrea Ruotolo, Fulbright PhD – Rockwell Automation

  Speaker: Warren Roos, PhD, PE – Rockwell Automation
• 4:25 PM – 4:30 PM PDT

  Closing Remarks
  

  Session Moderator: Ranjan Chatterjee – PDF Solutions