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Ofer Adan

Sr. Director of Tech Collaborations and Strategic Business Development, Imaging and Process Control Group
Applied Materials

Ofer Adan, is leading technical collaborations and strategic business development at Applied Materials Imaging and Process Control Division. Adan is a principal member of technical staff at Applied Materials where he held various roles, leading solutions in metrology inspection and process control since 2001.

Adan chaired SPIE Advanced Lithography’s Metrology Inspection and Process Control conference. A conference planning steering committee member in FCMN and the Lithography Workshop conferences. Adan has been teaching a course on Advanced concepts in Metrology Toolset Stability and Matching at SPIE.

Adan has several patents including the first patent on using high energy for SEM Overlay, and over 50 publications on metrology, inspection, process control, failure analysis, and fracture. Adan was awarded several best paper awards at various conferences among them the SPIE Diana Nyyssonen Memorial Award.

Adan received an M.Sc. degree in electronic materials engineering from Ben Gurion University. Where Adan developed a failure criterion for crack propagation in a re-entrant angle under thermal loading and applied it to improve reliability of interfaces between interconnects and passivation layers in CMOS imaging devices.

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