Director of Test Technology
Advantest Corporation
san jose, California, United States
A background in electronic warfare, computer science and device physics, Bob has been involved in all aspects of ATE and SLT design & deployment for characterization, PSV and HVM solutions for high pin count HSIO, HPC and complex chiplet based devices. His many years in engineering and application roles at various test and semiconductor companies, he’s currently a Director of Test Technology at Advantest Corporation focused on next generation test solution definition for ML/AI and 5G devices. Additionally, as part of Advantest’s UCIe membership he participates on several working groups to address testability requirements and test access methods.
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High Performance Compute Devices and the Road to 2,000A
Wednesday, July 12, 2023
10:50 AM – 11:15 AM PDT